Improvement and analysis of measuring thickness using interference microscope;
用干涉显微镜测量薄膜厚度的改进与分析
Upgrade of the 6JA interferometer based on vertical scanning white-light interferometric;
基于垂直扫描白光干涉法的6JA干涉显微镜的改造
Surface microtopography, representation and tracer of microscale vortex dislocation of hydrothermal synthetic sapphires and natural beryls are studied by using atomic force micro-scope and interference microscope.