passive gamma ray assay

Crystallization process of CoSi2 thin films prepared by radio frequency magnetron sputtering have been investigated by in situ X-ray diffraction.

利用射频磁控溅射方法制备了具有CoSi2成分的非晶薄膜,对非晶薄膜的晶化过程进行了原位X射线分析。

X-ray apparatus for structure analysis

结构分析用x射线分析

energy-dispersive X-ray analysis (EDX)

能量分散x射线分析

non-dispersive X-ray analysis (NDXA)

非分散性X射线分析

portable X-ray analyzer

携带式x射线分析仪

energy dispersion x ray analysis

能量色散x射线分析

wavelength-dispersive X-ray analysis

波长色散x-射线分析

energy-dispersive X-ray analysis

能量色散x-射线分析

neutron-capture gamma-ray analysis (NCGA)

中子俘获γ射线分析

nondispersive X-ray analyzer

非色散x射线分析器

electron probe X-ray analyzer

电子探针x射线分析器

vacuum fluorescence X-ray analyzer

真空荧光x射线分析器

microbeam X-ray analyzer

微束X-射线分析器

ion induced x ray analysis

离子感生x 射线分析

X-ray Diffractive analysis of Crystal Structure ?

X-射线衍射晶体分析

x ray fluorescence spectroscopy

x 射线荧光光谱分析

fluorescent X - ray spectroscopy

荧光x-射线光谱分析

Geiger steel analyzer

盖革x射线钢分析仪

X-ray probe micro-analyzer

x射线探针微量分析仪